Abstract
Abstract Under suitable imaging conditions using the weak-beam method of electron microscopy, constrictions in the stacking faults of dislocations in Ge become clearly visible. After deformation at relatively low temperatures they occur at an average separation of 950 Å. In short segments they reduce the width of the stacking fault.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
