Abstract
In this paper, we propose a configurable pulse generator for neuromorphic devices to verify the resistance change characteristics of neuromorphic devices. In general, the resistance change characteristics of neuromorphic devices are verified based on both the number of pulses and pulse width. The proposed configurable digital pulse generator consists of two submodules: Pulse Width Controller (PWC) that determines the pulse width and Pulse Count Controller (PCC) that specifies the number of pulses. Due to the configurable property, the proposed pulse generator can be widely applied to the various environment to verify the neuromorphic devices. As an experiment, The digital pulse generator was designed using a CMOS 180nm process, and it was shown that it can be used to verify the resistance change characteristics of neuromorphic devices through operation verification.
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