Abstract
Dense polycrystalline samples of CaCu 3 Ti 4 O 12 (CCTO) were prepared by solid-state reaction method under a high hydraulic pressure of 700 MPa, and characterized by X-ray diffraction, scanning electron microscopy and atomic force microscopy (AFM). Probing of the conduction path in nanoscale by AFM reveals that the grain boundary layer is conductive in CCTO. Therefore, reported giant-dielectric response in CCTO can not be understood by the model of conducting grains surrounded by insulating grain boundaries, which is usually used for the explanation of conventional internal barrier layer capacitors.
Full Text
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call