Abstract
Conductive atomic force microscopy (AFM) probes fabricated from silicon cantilevers coated with pyrolyzed parylene C (PPC) are described. This method offers a simple, inexpensive route to conductive AFM probes made from carbon materials. Fabricated probes were used in current-sensing atomic force microscopy (CS-AFM) to image nanometer-sized, metallic features. Future applications of PPC AFM probes include measurement of in situ corrosion and scanning electrochemical-atomic force microscopy.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
