Abstract
A report is presented on a new multi-mode nanofabrication method that uses a compliant conductive atomic force microscope (AFM) probe for both AFM and scanning tunnelling microscope (STM) operation and it is demonstrated that these modes can be switched ‘on-the-fly’ during the measurement or fabrication of nanostructures. The authors oxidised Ti with the same conductive AFM probe in AFM and STM modes, alternately in a continuous writing step. An in-plane Ti–TiOx–Ti junction was fabricated by combining AFM and STM modes and electrically characterised by taking current images in conductive AFM mode. After measurement, additional features were written to increase the electrical isolation, thus realising in situ nanoscale modification.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
