Abstract
The effects of shot and detector noise on well-resolved measurements of line strength are investigated. Simple analysis, computer simulation and numerical analysis are applied to determine optimum absorber quantities for both conventional and Fourier transform spectrometers. The sensitivity of these optimum absorber quantities to line shape, noise level and spectral resolution are investigated and shown to be small. Inherent bias in line strength measurements is explained and shown to be resolution sensitive. Consequences for experimental strategy are discussed.
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