Abstract
We present computer simulation results for the images of various types of structural defects in 6H-SiC and Si single crystals with taking into account noise factors (background heterogeneity and contrast graininess). If we know the parameters used to simulate the image, we can increase the reliability of defect identification and location in the single crystal’s bulk and find the quantitative and qualitative characteristics of defects by comparing the experimental and theoretical noise contrast.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
