Abstract
The “dark” current–voltage (I–V) response of CH3NH3PbI3 organic–inorganic halide perovskite (OIHP) thin films is studied as a function of temperature, voltage, and scan rate to investigate the nature of the I–V hysteresis. This is to address the apparent discrepancy observed in characteristics of the I–V hysteresis. Depending on the measurement conditions, two complementary mechanisms appear to control the I–V behavior. First, ionic species contribute to the conduction, and because of their slow-moving nature, a slower scan rate gives ions enough time to take part in conduction (i.e., below a relaxation frequency). Second, migration of ionic species to the interface(s) modulates the Schottky junction and, consequently, the electronic transport across the interfaces. Therefore, a slower scan rate results in more charge accumulation at the interface, which leads to a decrease in the leakage current. These findings provide an explanation that resolves the ongoing debate regarding the characteristics of the I–V hysteresis in solar cells based on OIHPs.
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