Abstract
There were studied glaze layers of fragments of painted tiles estimated by art historians basing on external signs as fabricated in the Netherlands in the 18th century. The paper presents results of glaze surface composition measurements by X-ray fluorescence (XRF) and X-ray photoelectron spectroscopy (XPS), time-of-flight mass-spectroscopy (TOF-$$$SIMS) methods in comparison with literature data. Information on composition of glaze layers including pigments will be used obtained in this research will be used in further conservation efforts.
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