Abstract
The complex behavior of the magnetic-field-induced cross-over instability of a filamentary current formed by an impact ionization process has been investigated in high-purity n-GaAs at 4.2 K. By applying a longitudinal magnetic field B, the holding voltage of the current filament shifts toward a higher voltage and crosses over the breakdown voltage with B⪆ B c ( B c ranged from 25 to 47 mT). Three types of cross-over instability are classified and discussed by using the doubly S-shaped current-voltage characteristics deduced from a physical model. The various nature of the cross-over instability is attributed to geometric effects of the current filament. A mathematical model is presented to demonstrate the generalized cross-over instability.
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