Complex permittivity measurements of low-loss microwave ceramics employing higher order quasi TE0np modes excited in a cylindrical dielectric sample

Abstract

Higher order quasi TE0np modes have been used for precise measurements of permittivity and dielectric loss tangent of low-loss dielectric ceramics versus frequency in the microwave frequency range. It has been shown that, using this technique, dielectrics having arbitrary permittivity value and dielectric loss tangent values in the range 10−6–10−2 can be measured with relative uncertainties below 0.5% for real permittivity and below 5% for dielectric losses. Several dielectric materials have been measured including single- crystal quartz, single-crystal sapphire and the low-loss microwave ceramics BMT, BZT and BZNT.