Abstract

Antidot lattices made of magnetic thin films are good candidates to be employed in future magnetic recording media. In this manuscript we present a study on the effect of shape and field-induced magnetic anisotropies on the magnetization reversal of 10 nm and 50 nm thick permalloy antidot lattices. Rounded antidot square lattices were fabricated using a combination of electron beam evaporation and laser interference lithography, covering surfaces of a few cm2. We demonstrate that a magnetic anisotropy induced in the samples, as a consequence of an applied magnetic field during growth, competes with the shape anisotropy that dominates the response of the patterned thin films, and that the effect of the field-induced magnetic anisotropy scales with the thickness of the antidot thin films. Finally, we have quantified the anisotropy constant attributable to the uniaxial field-induced magnetic anisotropy in our antidot lattices. These findings are supported by micromagnetic simulations performed using MuMax3.

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