Abstract

The knowledge advancement in the physics of silicon dioxide has promoted ground-breaking progress, from microelectronics to fibre optics. However, the SiO2 exciton decay mechanism is still mostly unrevealed. Here, we analyse the temperature dependence of interband-excited luminescence and the reflectivity by means of synchrotron radiation on a wide selection of SiO2 materials. This enables us to decouple the band-to-band recombination steps from non-radiative decay pathways that typically mask the relaxation mechanisms. We show that band-to-band excitations decay into two competitive correlated channels leading to green and red luminescence so far ascribed to independent transitions. Here we discuss the assignment to a dual relaxation route involving either ‘free’ or ‘interacting’ non-bridging-oxygen sites. Such an interpretation suggests an explanation for the elusive non-bridging-oxygen centres in quartz. The reflectivity spectra finally demonstrates a general relationship between exciton spectral position and bandwidth in SiO2 and clarifies the role of disorder in exciton localization.

Highlights

  • The knowledge advancement in the physics of silicon dioxide has promoted ground-breaking progress, from microelectronics to fibre optics

  • We investigated a set of silica and quartz specimens rationally selected so as to represent the largest variety of SiO2-based materials currently known

  • Such comparative approach is strategic for two main reasons: First, it enables us to distinguish the spectral signatures of the self-trapped exciton (STE) decay from different sample-dependent photoluminescence contributions

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Summary

Introduction

The knowledge advancement in the physics of silicon dioxide has promoted ground-breaking progress, from microelectronics to fibre optics. Despite the fundamental role of elementary NBO point defects in bond-breaking events in SiO2, their red photoluminescence has never been observed in quartz, except for locally amorphized crystals by neutron irradiation[37,38] For this reason, early interpretations of the band-to-band excited photoluminescence spectra did not explicitly consider the NBO emission as a possible contribution to the radiative decay of STEs. Aim of the present work is to obtain a definite spectral insight into the relationship between NBO and STE, so as to face an unresolved critical point. By using synchrotron light band-to-band excited photoluminescence experiments conducted over a wide range of temperatures on a comprehensive set of silica specimens obtained through different synthetic methods and treatment conditions, as well as on pristine and neutron-irradiated quartz, we reveal that the band-to-band excited green and red luminescence in silica are not independent transitions, but instead arise from the bifurcation of the decay process of intrinsic excitations into a dual relaxation route involving either ‘free’ or ‘interacting’ NBO configurations. Our data suggest an explanation for the absence of the red luminescence in untreated quartz and a general relationship between exciton trapping and structural disorder in SiO2

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