Abstract
The electrical properties of lead zirconate titanate (PZT) and strontium bismuth tantalate (SBT) thin films are compared for nonvolatile random access memory applications. PZT thin films have high switchable polarization with poor fatigue resistance and higher leakage current densities as compared to SBT thin films deposited on platinized silicon substrates. Characterization of these films in terms of their domain dynamics under application of sub-switchable and switchable electric fields give valuable insight about the observed differences in the electrical behavior. In the present work the dielectric behaviors of SBT and PZT thin films at sub-switchable electric field were analyzed in terms of Rayleigh law. The reversible and irreversible polarization component of switchable polarization was separated by the measurement of capacitance-voltage (C-V) and polarization hysteresis loops. The conduction mechanisms in these films were evaluated by measuring field dependence of leakage current densities at various temperatures. The observed differences in electrical properties are explained in terms of the intrinsic defects and defect-domain interaction of these two materials.
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