Abstract

This study compared eight sublimation scanning sprays in terms of their effect on 3D scanning results, coating thickness, and sublimation time. The work used an automated spraying system to ensure the same deposition conditions for all tested materials. All experiments were performed under the same environmental conditions to exclude the influence of the ambient environment on the coatings. All tested scanning sprays created coatings with thicknesses in the order of tens of micrometers that were detectable by the 3D scanner Atos III Triple Scan. The coatings must be applied carefully when accurate measurements are required. All used materials enabled the capture of the highly reflective surface of the Si-wafer. However, the differences between some sprays were significant. Sublimation time measurements showed that all coatings disappeared from the Si-wafer surface completely. Nevertheless, all coatings left visible traces on the mirror-like surface. They were easily wiped off with a cloth.

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