Abstract
Four random test generation strategies are compared to determine their relative effectiveness: equiprobable 0s and 1s; two weighted random pattern generation algorithms; and the maximum output information entropy principle. The test generation strategies are compared at a variety of target fault coverages. Two statistically based metrics are used to evaluate the techniques: a large-sample test of the difference of means and an upper confidence limit. The two weighted random test pattern generation strategies are found to be generally superior to equiprobable 0s and 1s and maximum output entropy. For a given logic circuit, the same technique is not necessarily optimal at every fault coverage. >
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
