Abstract
High-resistivity silicon detectors have been irradiated, respectively, with neutrons, protons and pions; fluences between 1·1012 and 4·1013 particles/cm2 were attained. Measurements ofI-V, C-V characteristics and Thermally Stimulated Current (TSC) analyses were performed before and after irradiation in order to monitor electrical and lattice damage induced by irradiation with different particles. Electrical degradation parameters have been determined; energy levels and concentrations of main radiation-induced defects have been attained by TSC analysis. Results show that different particles irradiation introduce mainly the same energy levels of induced traps in the bulk. An increase in concentration of the same kind of point defects with fluence has been also observed for the different irradiation particles.
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