Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase extraction from a single fringe pattern in fringe projection profilometry

Abstract

Fringe projection profilometry is widely used for three-dimensional (3-D) surface shape measurement using phase-shifting (PS) methods with multiple images or transform methods with single projected fringe pattern. In this paper, phase extraction methods from a single fringe pattern using different transform methods are compared using both simulations and experiments. The principles of Fourier transform (FT), windowed Fourier transform (WFT) and wavelet transform (WT) methods for fringe pattern processing are introduced. Implementation of 1-D and 2-D algorithms and phase compensation are discussed. Noisy and non-sinusoidal waveforms are involved into this comparison. The merits and limitations of each of these processing methods are indicated.