Abstract
We report structural and ferroelectric properties of epitaxial PbZr0.53Ti0.47O3 thin films on SrRuO3 and La0.5Sr0.5CoO3 grown on (100) LaAlO3 single crystal substrates, where all the films were deposited by the pulsed-laser deposition method. While the PbZr0.53Ti0.47O3 film on La0.5Sr0.5CoO3/LaAlO3 shows (00l)-oriented heteroepitaxial growth with a rhombohedral structure, the PbZr0.53Ti0.47O3 film on SrRuO3/LaAlO3 shows a tetragonal mixture of (00l) and (h00) heteroepitaxial growth and the (00l)-oriented rhombohedral heteroepitaxial growth. The mixture of the rhombohedral and the tetragonal structures of the PbZr0.53Ti0.47O3 film on SrRuO3/LaAlO3 influences the ferroelectric properties by domain pinning.
Published Version
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