Abstract
Background:Staphylococcus epidermidis is considered the upper respiratory tract's human skin flora and mucosal membrane and displays low pathogenic capacity in healthy individuals. Drug-resistant strains can be identified as a natural result of the microflora through antibiotic therapy and are a possible cause of pathogenic strain resistance genes. Methods:Culture, biochemical analysis and Vitek®2 Utilizing for identified the One hundred and fifty swab sample was collected from different wounds infected. S. epidermidis strain's ability to resist antibiotics was tested using a disk diffusion method. Result of antibiotic sensitivity test was confirmed and supported by Vitek®2 system. Also, the PCR antibiotic resistance gene was detected. Results: Out of 150 swab samples, twelve were positive for S. epidermidis.. Disc method was shown the 75%,66.7%,83.3% and 58.3% harboured highest prevalence of antimicrobial resistance against penicillin, oxacillin, cefoxitin and erythromycin respectively.While the moderate prevalence 50.7%,41.7% and 33.3% of resistance against tetracycline,clandomycin and ciprofloxacin respectively. Furthermore, lowest incidence was shown the 25% for both of resistance against rifampin, and gentamycin. The Vitek®2 system was confirmed and support antibiotic sensitivity test. A most frequently found antibiotic resistance genes amongst S. epidermidis strains, according to the findings, were mecA (91.7%), blaZ (91.7) , ermA (16.7%),ermB (25%),ermC (25%), tetM (25%), tetK (33.3 %) and aacA-aphD (41.7%) respectively. All S. epidermidis strain doesn't have ,vanA and vanB antibiotic resistance gene. Conclusion:Frequency of resistance to antibiotic should be detected more than one method , and used the Vitek®2 system detected the antibiotic resistance gave better support for result. Additional PCR technique, actually very important to detect antibiotic resistance genes of S. epidermidis strains.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: Periodicals of Engineering and Natural Sciences (PEN)
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.