Abstract
Ternary chalcopyrite copper aluminum disulphide (CuAlS2) thin films were deposited on glass substrate using chemical spray pyrolysis (CSP) and hydrothermal (HT) method. The phase identification, morphology, optical and electrical properties were investigated using X-ray diffraction technique (XRD), scanning electron microscopy (SEM), UV-Vis spectroscopy (UV-Visible) and impedance spectroscopy (IS) respectively. From XRD patterns, high crystallinity and presence of tetragonal phase of CuAlS2 are confirmed. The CuAlS2 film prepared by CSP shows the optical bandgap of 3.1 eV and 3.26 eV for HT method respectively. The formation of microsphere like morphology and higher electrical conductivity are observed for CuAlS2 thin films by HT method.
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