Comparative study of (111) and (100) crystals and capacitance measurements on Si strip detectors in CMS

Abstract

For the construction of the silicon microstrip detectors for the Tracker of the CMS experiment, two different substrate choices were investigated: A high-resistivity (6 k cm) substrate with (111) crystalorientation and a low-resistivity (2k cm) one with (100) crystalorientation. The interstrip and backplane capacitances were measured before and after the exposure to radiation in a range of strip pitches from 60 μm to 240 μm and for values of the width-over-pitch ratio between 0.1 and 0.5.