Abstract
Cerium oxide nanostructured thin films, as well as their variants doped with Gadolinium (Gd), Neodymium (Nd) and Indium (In), were successfully deposited onto both glass and ITO substrates using the spray pyrolysis method. Their structural, morphological, optical, and electrochemical properties were then experimentally studied. X-ray diffraction (XRD) has confirmed the generation of a single-phase polycrystalline cubic fluorite structure of CeO2. The crystallite size and microstrain of the thin films were found to depend on the type of doping element. Red-shift, peak broadening, and asymmetry in the Raman mode (F2g), as well as a red-shifted energy gap, were confirmed through Raman spectroscopy and UV–Vis–NIR analyses. SEM images reveal nanograin formation in all the films, while EDS analysis confirms the presence of the elements. The electrochemical measurements indicate that doping CeO2 with Gd, Nd, and In enhances its electrochemical properties. Furthermore, the doped CeO2 thin films maintain full transparency during the intercalation and deintercalation of Li + ions. Such pivotal findings broaden the potential applications of this oxide, particularly in supercapacitors and electrochromic devices.
Published Version
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