Abstract
The growth behavior of ZnO nanorods on various substrates including Si (1 1 1), Si (0 0 1), Al 2O 3 (0 0 0 1), GaN/Al 2O 3 (0 0 0 1) and ZnO (0 0 0 1) by metalorganic chemical vapor deposition without using any catalyst was investigated in a comparative way. The alignment of ZnO nanorods greatly depends on the substrates used for the growth. The ZnO nanorods grown on Si (1 1 1) and Si (0 0 1) are vertically aligned but randomly oriented in the in-plane direction. The vertically aligned ZnO nanorods grown on Al 2O 3 (0 0 0 1) show an in-plane alignment with a broad mosaic distribution of ∼9°. In contrast, epitaxially aligned ZnO nanorods with an extremely narrow in-plane and out-of-plane mosaic distribution grow on the lattice-matched substrates such as GaN/Al 2O 3 (0 0 0 1) and ZnO (0 0 0 1) without showing a continuous interfacial ZnO layer observed in the samples grown on Si (1 1 1), Si (0 0 1) and Al 2O 3 (0 0 0 1). Differently from the alignment nature, all the ZnO nanorods exhibit only high band edge emission peaks with no noticeable deep level emissions in the low-temperature photoluminescence measurements, supporting that the crystalline and optical quality of an individual ZnO nanorod is basically similar irrespective of the type of the substrates used.
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