Abstract
We have simulated the optical properties of micro-fabricated Fresnel zone plates (FZPs) as an alternative to spatial light modulators for producing non-trivial light potentials to trap atoms within a lensless Fresnel arrangement. We show that binary (1 bit) FZPs with wavelength (1 μm) spatial resolution consistently outperform kinoforms of spatial and phase resolution comparable to commercial SLMs in root mean square error comparisons, with FZP kinoforms demonstrating increasing improvement for complex target intensity distributions. Moreover, as sub-wavelength resolution microfabrication is possible, FZPs provide an exciting possibility for the creation of static cold-atom trapping potentials useful to atomtronics, interferometry, and the study of fundamental physics.
Highlights
Atom interferometry is a powerful tool for precise measurements and metrological technologies
The simulations show that a two level Fresnel zone plates (FZPs) consistently has an rms error lower than that of a kinoform comparable to an spatial light modulator (SLM)
Examples of the calculated kinoforms for FZPs illuminated by a Gaussian and producing a ring and beam splitter are shown in figure 6
Summary
Atom interferometry is a powerful tool for precise measurements and metrological technologies. It can be used for a wide range of applications, from the determination of fundamental constants and cosmological phenomena [1, 2] to navigation applications such as accelerometers and gyroscopes [3,4,5]. Within previous demonstrations of all-optical ring trapped BECs, the azimuthal variation of the ring minimum was far below the chemical potential of the BEC, with these rings produced through a variety of methods such as painted potentials [25] or combinations of confining light sheets with shaped light, for instance, Laguerre–Gaussian beams [19,20,21, 26], co-axial focused beams [18], or conical refraction based beams [27]. To successfully produce trapping potentials for BEC, we must aim to match or surpass the above limit on azimuthal variation, aiming to produce traps of μK depth with a roughness of below 1%
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