Abstract
Automatic Test Pattern Generation Automatic Test Pattern Generator is an electronic de-sign automation method used to find an input sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The designs selected for comparison use LFSR as its core central component around which the entire algorithms are based which contribute in construction of Automatic test pattern generator. The LFSR is considered as it gives excellent random characteristics and has a low area overhead which allows it to be placed in the integrated circuit
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
