Abstract
The results of the comparative study of the Ba1.4Y1.0Cu2.4O7.0/SrTiO3 epitaxial structure by the TXRF method under conditions of the exciting flux formation by a slit-cut system and a planar x-ray waveguide resonator (PXWR) with a specific design are presented. Experimental measurements were performed on a TXRF-model spectrometer built on the base of an HZG-4 precision digital goniometer. The spectrometer setup supplied the immutability of the x-ray optical scheme upon changing the exciting flux former. As a result, we found conditions where the TXRF analysis of the testing target is more effective with the use of the PXWR exciting flux former.
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