Abstract
The Compact-Physical (Comphy) framework is tested against the experimental Negative Bias Temperature Instability (NBTI) data. A cost-function based optimizer is used for obtaining the parameters of Comphy. The ultrafast (10 μs delay) measured threshold voltage shift (ΔVT) during and after NBTI stress at various stress (VGSTR) and recovery (VGREC) bias, temperature (T) and stress time (tSTR), and mixed AC–DC stress using random VGSTR, VGREC, pulse duty cycle (PCD) and frequency (f) are used to test the model framework. The BTI Analysis Tool (BAT) framework, for which data from previous work is used, and Comphy are compared.
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