Abstract

In this paper, we analyze and characterize the metastability of 11 previously proposed high-performance flip-flops, reduced clock-swing flip-flops, and level-converting flip-flops. From extensive simulation results in 65nm CMOS technology, the main metastability parameters of ¿ and T <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0</sub> are extracted and analyzed at both nominal and reduced supply voltage. Our simulation results indicate that these flip-flops exhibit a wide range (up to few orders of magnitudes) of metastability windows. In particular, flip-flops with differential and positive feedback configuration such as the sense-amplifier based flip-flops demonstrate the most optimal metastability. Based on this finding, a novel pre-discharge flip-flop (PDFF) with positive feedback configuration is proposed. Extensive simulation results reveal that PDFF achieves better metastability than the previous proposed flip-flops at both nominal voltage supply and nominal voltage supply with reduced clock-swing.

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