Abstract
In 1970 a paper was published by Park, Houston and Schreiner 1 describing a soft X-ray appearance potential spectrometer. This seemed to be a very simple instrument that could provide results similar to those obtained by Auger spectroscopy but using simpler and less costly apparatus. It was decided to construct a similar instrument and to assess its usefulness. The purpose of this paper is to describe an appearance potential spectrometer (APS), to present a simple theory, to discuss some of the practical problems and to illustrate and (in some cases) explain some inadequacies of the simple theory.
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