Abstract
A low noise soft x-ray appearance potential spectrometer has been constructed. It consists of a liquid nitrogen-cooled silicon surface-barrier diode that detects the variations in the emitted photon flux. A 500 Å thick Al window acts as a discriminator for low energy photons (visible light and the tail of the bremsstrahlung). The performance of the detector arrangement has been tested on clean Ni films and chemisorbed O on these films. It is shown that the detector behaves ideally, i.e., the signal-to-noise ratio is limited by the shot noise in the photon flux for primary electron beam intensities in the range tested (30–600 μ A) and for electron energies, 300–900 eV.
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