Abstract
In this comment we show how the claim of Hernando et al (1998 J. Phys. D: Appl. Phys. 31 637) of an enhanced magnetoresistance of 130% with a field sensitivity of 6%/Oe in Co/Ni sputtered multilayers is based on a misinterpretation of the magnetoresistance effect. To illustrate this we use their square four-point probe arrangement to obtain a magnetoresistance effect of 176% with a field sensitivity of 11.7%/Oe in a sputtered permalloy film. We present critical analysis of this `extraordinary' effect showing that the high magnetoresistance values obtained are not intrinsic to the material but are an artefact of the measurement method.
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