Abstract
The atomic force microscope (AFM) is a flexible instrument that can be used for imaging, measuring forces and elastic properties and manipulating a variety of samples, at high resolution. The applicability of AFM is further extended in combination with light microscopy as optics deliver more bulk details and by fluorescence, compositional contrast. To date, the combination of AFM and light microscopy has been limited to samples on transparent substrates, where AFM has top-down access to the sample and an inverted light microscope has bottom-up access to the same area [1, 2].
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