Abstract
The detection of coincidental emissions (electron–ion, ion–ion, photon–ion) can enhance the amount of information available in desorption time-of-flight mass spectrometry (TOF-MS) by identifying physical, chemical and/or spatial correlations. This paper outlines the conditions for coincidence measurements and the methodology for identifying correlations. Applications of coincidence–correlation mass spectrometry include the study of the composition and structure of polyatomic ions, the process involved in ion production from solids and the chemical microhomogeneity of surfaces. © 1997 John Wiley & Sons, Ltd.
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