Abstract
Small electron probes of 10-15 Å in diameter can be easily formed at specimens in scanning transmission electron microscopes (STEM) using field emission guns (FEG). Nanodiffraction patterns from individual small metal particles (< 50 Å) obtained with such a probe contain non-overlapping CBED disks. As a first order approximation, these patterns can be interpreted similarly to those for parallel beam illumination and then bulk crystallographic information is obtained. However there is more information contained in the nanodiffraction patterns. In the case of small metal particles, spot splitting occurs when the small electron beam is close to a particle edge, which results from the coherence of the probe. Spot splitting is a manifestation of a crystallographic surface plane of a particle being parallel to the beam since the splitting is along the direction normal to the particle edge. This phenomenon is one of the characteristic features of coherent electron nanodiffraction patterns of small metal particles. It will be shown that it is essentially a particle size effect!
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More From: Proceedings, annual meeting, Electron Microscopy Society of America
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