Abstract
Stress development during cofiring a bi-layer ferrite/dielectric laminate has been investigated by measuring camber development and shrinkage rate difference. The trend of camber development follows a similar pattern to the linear shrinkage rate difference between ferrite and dielectric ceramics. No cofiring defects are observed in the multilayer structure of ferrite and dielectric laminates, indicating that good sintering compatibility between BZN and NiCuZn ferrite exists during cofiring.
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Schedule a callMore From: IOP Conf. Series: Materials Science and Engineering
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