Abstract
Abstract This paper presents a simple, practical, and effective backface-culling technique for clusters of polygons, as well as a method for generating efficient clusters from a set of triangle strips. The cluster-backface test is directly derived from the traditional single-polygon test, and has about the same complexity. Memory requirements are 40 bytes per test. Cluster-backface tests may be arranged hierarchically, and frontface tests added for symmetry. Experiments show graphics performance improvements of up to 50 percent in terms of the number of effective polygons rendered per second.
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