Abstract
Structure and morphology of epitaxial [Fe/Cr]30 multilayers with ultrathin Fe layers (nominally 0.12 nm and 0.08 nm) have been investigated by X-ray reflectivity, synchrotron Mössbauer spectroscopy at low temperature and grazing-incidence small angle X-ray scattering (GISAXS). The films demonstrate Kondo-like behavior of electrical resistivity. The GISAXS patterns reveal their cluster-layered structure. The observed side maxima give the information about the sizes and distances between lateral inhomogeneities. Mössbauer reflectivity spectra measured below the critical angle of the total reflection support the existence of the cluster-layered structure of the samples. Magnetic hyperfine field distributions show that largest number of 57Fe atoms is situated in interfaces of iron clusters and their number increases in the thinnest films.
Published Version
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