Abstract
All angles between facets in CuInSe 2 Bridgman-grown crystals were measured and confirmed, by X-ray Laue patterns and diffractometry, to be accounted for by three planes: {101}, {112} and {110}. The {110} facets were less frequent and were found to consist of {112} microcleavages. The {101} cleavages occurred most frequently and it is speculated that this is due to the smaller energy required to break a smaller number of the stronger Se–Cu bonds (compared with the weaker Se–In bonds) than for {112} cleavages.
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