Classification of Sequential Circuits Based on τk Notation

Abstract

In this paper, we introduce a new test generation complexity notation called /spl tau//sup k/ notation, which consists of /spl tau//sup k/-equivalent and /spl tau//sup k/-bounded, in order to clarify the classification of sequential circuits based on combinational test generation complexity. We reconsider the test generation complexity for the existing classes of acyclic sequential circuits. Several new classes of sequential circuits that cover some cyclic sequential circuits have been identified as being /spl tau/-equivalent and /spl tau/-bounded.