Max-Testable Class of Sequential Circuits having Combinational Test Generation Complexity

Abstract

The paper uses the concept of time expansion model (Innoue et al., 2000) to find the test generation for acyclic sequential circuits. It identifies a class of sequential circuits called as max-testable sequential circuits, where test generation can be obtained using a combinational test generator with the capability of detecting multiple faults on a kernel of combinational circuit. Any acyclic sequential circuit without hold registers belongs to this class. For the sequential circuits having hold registers, a subset of such circuits is found to be belonged to max-testable class. The paper also suggests an algorithm to find such class of circuits.