Abstract
In current testing, the number of test vectors is usually A testing circuit for built-in current testing is proposed and a test generation method using the testing circuit is described. The function of the testing circuit is to measure the integral of the current including the dynamic current during a certain time interval and to judge whether the Cuir is fault-free or not by the measured value. The function01 speed of the testing circuit is rapid because this measuring method is not influenced by any dy,rlamic current. We also describe the test generation method briefly. The test sequences cause almost equal dymmic current between every two test vectors. The number of test vectors in each test sequence is less than that of the traditional testing for stuck-at faults.
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