Abstract
A realistic modeling of circuit output error patterns with random test inputs is suggested. The model can be used as the basis for accurate evaluation of the probability of aliasing in compact testing. For several example compression techniques, the following aspects are investigated: identification of the error patterns that cause aliasing; asymptotic effectiveness analysis; and comparative simulation study with a limited number of random test vectors applied.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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