Abstract

This paper reports on an investigation of the wear of chromium oxide based very thin films. Linear data tape Advanced Digital Recording (ADR™) heads coated with 20- and 40-nm thick chromium oxide films have been tested subject to temperature/humidity matrix of 10 to 40°C/10 to 80% in order to assess the wear behaviour of the coating as a function of environment. The tested heads were analysed at various stages of wear, by use of optical microscopy (OM), atomic force microscopy (AFM) and Auger electron spectroscopy (AES). The results show that the most severe damage occurs at the highest relative humidity (80% RH) and for a given humidity, at the lowest temperature (10°C). Inversely, stain transferred from the tape to the head surface predominates at the lowest humidity (10% RH). Stain therefore appears to protect the coating against wear with the degree of protection increasing with the temperature. The wear process differs according to the coating thickness. This is attributed to the location of the maximum subsurface stress with respect to the coating/substrate interface. It is shown that this maximum stress occurs below the interface for 20 nm and at the interface for 40 nm thick coatings. This correlates to different observed wear modes.

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