Abstract
Due to high cutting speeds and low single grain chip thicknesses no reliable approach to interrupt the cut in grinding was realized so far. This paper presents a new method to experimentally obtain and analyze chip roots during up-grinding. By means of high resolution SEM-micrographs several chip roots are analyzed, classified and discussed with regard to the fundamental chip formation and material removal mechanisms. Furthermore, there are conclusions drawn about the distribution and number of the active grains, which are in a good correlation with the Abbott-curve of the grinding wheel layer and the process parameters.
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