Abstract

Abstract We investigate the effective oxidation state and local environment of yttrium in photochromic YHO thin film structures produced by e-beam evaporation, along with their chemical structure and optical properties. Transmission electron microscopy images reveal the oxidized yttrium hydride thin film sample exhibiting a three-layered structure. X-ray photoelectron spectroscopy (XPS) measurements manifest that the oxidation state of yttrium is modified, dependent on the film’s composition/depth. Furthermore, Ion beam analysis confirms that this variability is associated with a composition gradient within the film. X-ray absorption spectroscopy at the Y K-edge reveals that the effective oxidation state of yttrium is approximately +2.5 in the transparent/bleached state of YHO. Spectroscopic ellipsometry investigations showed a complex non-linear optical depth profile of the related sample confirming the dominant phase of YHO and the presence of Y2O3 and Y towards the middle of the film. The first evidence of (n; k) dispersion curves for e-beam sputtered photochromic YHO thin films are reported for transparent and dark states.

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