Abstract
X-ray photo-electron spectroscopy (XPS) studies were performed on dc sputtered superconducting Pb-doped Bi-Sr-Ca-Cu-O-films. A change in composition in as-deposited and annealed films was observed on the surface of the films. This may be related to the reduction in surface free energy due to the segregation of bismuth from bulk to the surface. Further, the change in binding energies of the constituent elements before and after the annealing were also observed. These results were correlated with the superconducting transition of the films after annealing.
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