Abstract
PurposeThe purpose of the paper is to discuss the chemical characterisation of inorganic and organic materials found in electronic systems.Design/methodology/approachThe paper provides an introduction to Fourier transform infrared spectroscopy, which is used for the chemical characterisation and analysis of materials. Examples from recent case studies are given to illustrate the work.FindingsIt was found that Fourier transform infrared spectroscopy can successfully identify materials at various stages of their lifecycle. By this means any contaminants and their resulting detrimental effects can be eliminated.Originality/valueThe paper demonstrates how the chemical analysis of a material is conducted, and what can be learned from the investigation.
Published Version
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