Charge density analysis of SiO2 under pressures over 50 GPa using a newdiamond anvil cell for single-crystal structure analysis

Abstract

Single-crystal structure analysis of SiO2 stishovite, (rutile type,P42/mnmz = 2)was carried out using the newly devised diamond anvil cell. The electron-densitydistribution was investigated at high pressures up to 50 GPa using synchrotronradiation at SPring-8 and a laboratory x-ray source generator of Ag Kα rotatinganode generator. Using large diamond crystal windows instead of beryllium for thecell has several advantages for single-crystal diffraction study supplying the largeQ-value.