Abstract
Charge build-up in magnetron-enhanced reactive ion etching (MERIE) was evaluated with metal nitride oxide semiconductor (MNOS) capacitors. In static magnetic field, negative flat band voltage (Vfb) shifts of more than -1.5 V were observed in the area under high-density plasma, and more than 2-V Vfb shifts were observed at the edge of the wafer near the N and S poles. This distributed Vfb shift was considered to result from nonuniform plasma potential caused by secondary electron E×B drift motion. In rotated magnetic field, Vfb shifts were reduced. No significant Vfb shifts were observed when the magnet was rotated at 120 rpm. The Vfb shift reduction in rotated magnetic field was supposed to result from charge neutralization by alternate charge build-up.
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